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Influence of finite sample thickness and distortion on the critical angle of total reflection

✍ Scribed by Eidner, K. ;Maybe, G. ;Schuster, R. ;Komitov, L. ;Peteov, A. G.

Book ID: 105378521
Publisher: John Wiley and Sons
Year: 1985
Tongue: English
Weight: 291 KB
Volume: 90
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210900136

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