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Determination of the critical thickness and the sensitivity for thin-film analysis by total reflection X-ray fluorescence spectrometry

✍ Scribed by Klockenkämper, R.; von bohlen, A.


Book ID
121387308
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
738 KB
Volume
44
Category
Article
ISSN
0584-8547

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