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Influence of film thickness on structural and optical properties of ZnS thin films obtained by SILAR method and analysis of Zn/ZnS/n-GaAs/In sandwich structure

✍ Scribed by Özakın, Oğuzhan ;Güzeldir, Betül ;Yıldırım, M. Ali ;Sağlam, Mustafa ;Ateş, Aytunç

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