Influence of experimental factors and film thickness on the measured critical load in the nanoscratch test
β Scribed by B.D. Beake; A.A. Ogwu; T. Wagner
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 119 KB
- Volume
- 423
- Category
- Article
- ISSN
- 0921-5093
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