Influence of epitaxial properties on the mutual inductance response of high-quality YBCO thin films

✍ Scribed by M.L. Lucia; J. Santamaria; F. Sánchez-Quesada; W. Lopera; M.E. Gómez; P. Prieto

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 546 KB
• Volume: 260
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(96)00120-7

✦ Synopsis

High-quality YBa2Cu307_ x films have been produced on SrTiO 3 (001) and NdGaO 3 (001) substrates. X-ray qb scans show a good in-plane texture but do not exclude the presence of domains at 90 °. Diamagnetic shielding properties obtained from mutual-inductance measurements show a double peak structure which may be ascribed to the presence of those domains. This point is further supported with an analysis of the normal-state resistivity. Films with an interdomain resistivity of 10 -5 l-I cm show a double peak structure in the mutual-inductance measurements and relatively low values of the critical current densities (1.5 × 10 s A cm -2 at 77 K), while films with interdomain resistivities lower than 10 -6 D cm show a narrow single peak and higher values of the critical current (106 A cm-2 at 77 K).