Influence of epitaxial mounds on the yield of integrated circuits : T. Yanagawa, Proc. IEEE 57, No. 9, September (1969), p. 1621

• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 105 KB
• Volume: 9
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(70)90456-7