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Influence of electromigration field on the step bunching process on Si(111)

✍ Scribed by Usov, V.; Coileain, C. O; Shvets, I. V.


Book ID
118247969
Publisher
The American Physical Society
Year
2010
Tongue
English
Weight
394 KB
Volume
82
Category
Article
ISSN
1098-0121

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