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Impact of the growth on the stability–instability transition at Si (111) during step bunching induced by electromigration

✍ Scribed by J.J. Métois; S. Stoyanov

Book ID: 117219964
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 283 KB
Volume: 440
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(99)00817-1

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