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Influence of dielectric breakdown on MOSFET drain current

โœ Scribed by Cellere, G.; Paccagnella, A.; Mazzocchi, A.; Valentini, M.G.


Book ID
114617694
Publisher
IEEE
Year
2005
Tongue
English
Weight
518 KB
Volume
52
Category
Article
ISSN
0018-9383

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