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Influence of Damage Depth Profile on the Characteristics of Shallow p+/n Implanted Junctions

โœ Scribed by Cembali, F. ;Seevidori, M. ;Landi, E. ;Solmi, S.


Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
296 KB
Volume
94
Category
Article
ISSN
0031-8965

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