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Influence of Crystal Orientation and Oxide Structure on the Interface States of GeGeO2

โœ Scribed by H. Flietner; G. Oertel


Publisher
John Wiley and Sons
Year
1970
Tongue
English
Weight
314 KB
Volume
41
Category
Article
ISSN
0370-1972

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Influence of crystal orientation in the
โœ J.Bebczuk De Cusminsky ๐Ÿ“‚ Article ๐Ÿ“… 1970 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 728 KB

An X-ray diffraction study was made of copper electrodeposited on low index planes of copper single crystals . Three characteristic stages occur during the process : (a) epitaxial growth, (b) twin development, (c) polycrystalline growth . The deposit thickness, Ah, attained just before polycrystall