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Influence of charge flow along a semiconductor surface on the nature of the multiplication coefficient in a silicon-wide-gap layer structure

✍ Scribed by Z. Ya. Sadygov; T. V. Jejer


Book ID
110123119
Publisher
SP MAIK Nauka/Interperiodica
Year
1997
Tongue
English
Weight
72 KB
Volume
23
Category
Article
ISSN
1063-7850

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