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Influence of backscattering on the spatial resolution of semiconductor X-ray detectors

✍ Scribed by M. Hoheisel; A. Korn; J. Giersch

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 399 KB
Volume: 546
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2005.03.028

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