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Influence of atomic force microscope cantilever tilt and induced torque on force measurements

✍ Scribed by Edwards, Scott A.; Ducker, William A.; Sader, John E.

Book ID: 121236836
Publisher: American Institute of Physics
Year: 2008
Tongue: English
Weight: 557 KB
Volume: 103
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.2885734

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