Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration

✍ Scribed by Slattery, Ashley D.; Blanch, Adam J.; Quinton, Jamie S.; Gibson, Christopher T.

• Book ID: 120520443
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 819 KB
• Volume: 131
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/j.ultramic.2013.03.009