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Individual, attractive defect centers in the SiO2-Si interface of μm-sized MOSFETs

✍ Scribed by M. Schulz; A. Karmann

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Understanding the role of buried Si/SiO2

✍ J.J. Hamilton; E.J.H. Collart; B. Colombeau; M. Bersani; D. Giubertoni; J.A. Sha 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 190 KB