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Indexing X-ray pattern lines by the method of constant parameters

✍ Scribed by Kharin, V. M. ;Davydov, G. V.


Book ID
114497719
Publisher
International Union of Crystallography
Year
1970
Tongue
English
Weight
234 KB
Volume
3
Category
Article
ISSN
0021-8898

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## Abstract Least‐square refinement of x‐ray powder diffraction patterns analyzed by the Rietveld method can yield structural information which had been unattainable or at least elaborate to obtain by conventional pattern analysis. The Rietveld method calculates a powder pattern on the basis of a s