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Increase of low-frequency-noise-generating defects in today's CMOS and BiCMOS technologies

✍ Scribed by D.C. Murray; N. Siabi-Shahrivar; A.G.R. Evans; W. Redman-White; J.C. Carter; J.L. Altrip

Book ID: 103952729
Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 517 KB
Volume: 4
Category: Article
ISSN: 0921-5107
DOI: 10.1016/0921-5107(89)90272-9

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