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Incorporation of sulfur, chlorine, and carbon into electroplated Cu thin films

โœ Scribed by M. Stangl; J. Acker; S. Oswald; M. Uhlemann; T. Gemming; S. Baunack; K. Wetzig

Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
670 KB
Volume
84
Category
Article
ISSN
0167-9317

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โœ B. M. BaลŸol; A. Halani; C. Leidholm; G. Norsworthy; V. K. Kapur; A. Swartzlander ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 374 KB ๐Ÿ‘ 2 views

A systematic study was carried out to investigate the distribution of sulfur (S) in CuInSe 2 (CIS) and Cu(In,Ga)Se 2 (CIGS) absorbers which were exposed to an H 2 S atmosphere at elevated temperature. Results demonstrated that S diusion into CIS layers was a strong function of the original stoichiom