✦ LIBER ✦

Incident beam effects in AED (Auger Electron Diffraction): the case of Cu(001)

✍ Scribed by I. Davoli; R. Gunnella; P. Castrucci; R. Bernardini; M. De Crescenzi

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 329 KB
Volume: 76
Category: Article
ISSN: 0368-2048
DOI: 10.1016/0368-2048(95)02504-9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Incident angle effect of the primary bea

Incident angle effect of the primary beam upon the mean depth of electrons in a target

✍ L Chaari; C Landron; A Toumi 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 362 KB

A reflection high energy electron diffra

A reflection high energy electron diffraction examination of the defect structure in GaAs(001) films grown by molecular beam epitaxy

✍ L. Däweritz; R. Hey; H. Berger 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 570 KB

Electron beam induced current (EBIC) as

Electron beam induced current (EBIC) as a function of the angle of incidence of the electron beam in a scanning electron microscope (SEM)

✍ A. Jakubowicz 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 308 KB

Auger electron spectroscopic study of th

Auger electron spectroscopic study of the CN anion: A study of the NaCN(001) surface in comparison with CO and N2

✍ H. Pulm; C.-M. Liegener; H.-J. Freund 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 500 KB

WC hnvc rccordcd the carbon and mmogen KVV Auger spccrra 01 NaCN. caciLed wiith X-rays. The .spcrLn are inlerpreled on the hns~s or nb rn;uo many-body calculations of the double hole shade energies and fnkznsiks or CN-. The nilrogen (KW) Auger sprr~rum or NLN is more slrnllx IO the N(KV\') specwum o

The first stages in the formation of ult

The first stages in the formation of ultrathin nickel layers on Ag(111): A low energy electron diffraction-Auger electron spectroscopy study

✍ M.-G. Barthès; A. Rolland 📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 448 KB

Determination of the heights of ledges o

Determination of the heights of ledges on θ′ plates in A1–4 wt% Cu by convergent beam electron diffraction and lattice plane imaging

✍ Y Bouazra; F Reynaud 📂 Article 📅 1984 🏛 Elsevier Science ⚖ 889 KB

The heights of ledges on 0' plates in Al-4 wt"/, Cu annealed for 90 min at 275°C after a solution treatment for 24 h at 540°C have been determined by convergent beam electron diffraction and lattice plane imaging. Ledges with smaller heights (between 0.29 and 2 nm) than those found by Weatherly and