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Incident-angle dependence of ion-induced electron emission from Al & Co films using swift heavy ion

✍ Scribed by R.S. Chauhan; Sarvesh Kumar; R.P. Singh; A. Mandal

Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 112 KB
Volume: 266
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2007.12.108

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