In Situ X-ray diffraction studies of ele
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M. Fleischmann; A. Oliver; J. Robinson
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Article
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1986
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Elsevier Science
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English
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A computer controlled X-ray diffraction system utilizing position sensitive photon counting techniques that is capable of investigating, in situ, structure at the solid/liquid interface, particularly that between an electrode and an electrolyte solution, is described. The application of this techniq