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In situ X-ray diffraction analysis on the crystallization of amorphous Ti–Ni thin films

✍ Scribed by Lei Zhang; Chaoying Xie; Jiansheng Wu


Book ID
113896270
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
227 KB
Volume
55
Category
Article
ISSN
1359-6462

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