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In situ transmission electron microscopy studies of radiation damage in copper indium diselenide

✍ Scribed by S.E. Donnelly; J.A. Hinks; P.D. Edmondson; R.D. Pilkington; M. Yakushev; R.C. Birtcher

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 204 KB
Volume: 242
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2005.08.089

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