In-Situ Thickness Measurement System for Porous Alumina Film Based on AFM and Spectrometer

✍ Scribed by Xiong, D; Zhang, H J; Zhang, D X

• Book ID: 121513022
• Publisher: Institute of Physics
• Year: 2006
• Tongue: English
• Weight: 147 KB
• Volume: 48
• Category: Article
• ISSN: 1742-6588
• DOI: 10.1088/1742-6596/48/1/200