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In situ synchrotron X-ray microdiffraction study of deformation behavior in polycrystalline coppers during uniaxial deformations

✍ Scribed by H.D. Joo; J.S. Kim; K.H. Kim; N. Tamura; Y.M. Koo


Book ID
113895174
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
339 KB
Volume
51
Category
Article
ISSN
1359-6462

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## Abstract A unique __in situ__ multiaxial deformation device has been designed and built specifically for simultaneous synchrotron small angle X‐ray scattering (SAXS) and wide angle X‐ray scattering (WAXS) measurements. SAXS and WAXS patterns of high‐density polyethylene (HDPE) and HDPE/clay nano