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Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light

✍ Scribed by A.R. Kilmametov; G. Vaughan; A.R. Yavari; A. LeMoulec; W.J. Botta; R.Z. Valiev


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
397 KB
Volume
503
Category
Article
ISSN
0921-5093

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