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In-situ synchrotron X-ray diffraction study of stress-induced phase transformation in Ti50.1Ni40.8Cu9.1 thin films

✍ Scribed by H. Wang; G.A. Sun; B. Chen; Y.Q. Fu; X.L. Wang; X.T. Zu; H.H. Shen; Y.P. Liu; L.B. Li; G.Q. Pan; L.S. Sheng; Q. Tian

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