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In-situ study of the degradation behaviour of GaAs MESFETs for hi-rel applications

✍ Scribed by R. Petersen; W. de Ceuninck; L. de Schepper; G. Grégoris


Book ID
108362237
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
263 KB
Volume
37
Category
Article
ISSN
0026-2714

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