In situ strain measurements of superconducting composites by depth and layer sensitive X-ray diffraction technique utilizing synchrotron radiation

✍ Scribed by H. Okuda; T. Arai; A. Toda; S. Ochiai; M. Sato; W. Prusseit

• Book ID: 113850574
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 389 KB
• Volume: 471
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/j.physc.2011.05.125