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In situ quantification of electrical isolation in STM-fabricated TiOx nanostructures

✍ Scribed by Hu, W.; Bain, J.A.; Ricketts, D.S.

Book ID: 114461779
Publisher: The Institution of Engineering and Technology
Year: 2012
Tongue: English
Weight: 205 KB
Volume: 7
Category: Article
ISSN: 1750-0443
DOI: 10.1049/mnl.2011.0678

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