Free-Exciton Photoluminescence as a Prob
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Bogani, F. ;Miglio, S. ;Sciortino, S. ;Taschin, A. ;Vinattieri, A.
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Article
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2000
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John Wiley and Sons
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English
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Optical techniques, in particular photoluminescence (PL) spectroscopies, are currently used as a probe of the sample properties in semiconductor physics. The information obtained from the combined study of the near band-edge radiative recombination, i.e. of the free-carrier, free exciton (FE) and bo