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In-situ non-ambient X-ray diffraction studies of indium tungstate

โœ Scribed by Tamam I. Baiz; Christophe P. Heinrich; Nathan A. Banek; Boris L. Vivekens; Cora Lind


Book ID
113758555
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
576 KB
Volume
187
Category
Article
ISSN
0022-4596

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โœ M. Fleischmann; A. Oliver; J. Robinson ๐Ÿ“‚ Article ๐Ÿ“… 1986 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 684 KB

A computer controlled X-ray diffraction system utilizing position sensitive photon counting techniques that is capable of investigating, in situ, structure at the solid/liquid interface, particularly that between an electrode and an electrolyte solution, is described. The application of this techniq