✦ LIBER ✦

In situ measurements of thickness changes and mechanical stress upon gasochromic switching of thin MoO[sub x] films

✍ Scribed by Okumu, J.

Book ID: 126865700
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 351 KB
Volume: 95
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1728309

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

In situ measurement of stress generation

In situ measurement of stress generation arising from dislocation inclination in Al[sub x]Ga[sub 1âx]N:Si thin films

✍ Acord, Jeremy D.; Manning, Ian C.; Weng, Xiaojun; Snyder, David W.; Redwing, Joa 📂 Article 📅 2008 🏛 American Institute of Physics 🌐 English ⚖ 411 KB

In situ stress measurements and mechanic

In situ stress measurements and mechanical properties of a composition range of NiTi thin films deposited at elevated temperature

✍ V.G. Kotnur; G.C.A.M. Janssen 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 751 KB

Mechanisms of crystallization of amorpho

Mechanisms of crystallization of amorphous Y1Ba2Cu3O7-x thin films during annealing in oxygen and argon atmospheres: “in situ” measurements.

✍ G. Garry; D. Dubreuil; Y Lemaitre; D. Dieumegard; J. Siejka; C. Ortega 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 157 KB