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In situ measurements of stress evolution in silicon thin films during electrochemical lithiation and delithiation

✍ Scribed by Vijay A. Sethuraman; Michael J. Chon; Maxwell Shimshak; Venkat Srinivasan; Pradeep R. Guduru


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
456 KB
Volume
195
Category
Article
ISSN
0378-7753

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