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In situ infrared ellipsometry study of the growth of hydrogenated amorphous carbon thin films

✍ Scribed by T Heitz; B Drévillon

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Early stages of the growth of hydrogenat

✍ T Heitz; B Drévillon; J.E Bourée; C Godet 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 125 KB

In situ infrared ellipsometry study of t

✍ N Blayo; B Drévillon; J Huc 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 281 KB

Quantitative study of C—H bonding in pol

✍ Heitz, T.; Drévillon, B.; Godet, C.; Bourée, J. E. 📂 Article 📅 1998 🏛 The American Physical Society 🌐 English ⚖ 345 KB

An EPR study of defects in hydrogenated

✍ Barklie, R.C.; Collins, M.; Cunniffe, J.; Silva, S.R.P. 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 664 KB

Improvement of sensitivity in the analys

✍ Heitz, Thibaut; Drévillon, Bernard; Godet, Christian 📂 Article 📅 1999 🏛 Optical Society of America 🌐 English ⚖ 133 KB

Infrared ellipsometry study of the oxida

✍ N. Blayo; B. Drévillon 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 638 KB