𝔖 Bobbio Scriptorium
✦   LIBER   ✦

In-situ HVEM Investigations under the Influence of Ion Beams

✍ Scribed by Dr. W. A. Jesser

Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
423 KB
Volume
14
Category
Article
ISSN
0232-1300

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Investigation of the atomic interdiffusi
Investigation of the atomic interdiffusion and phase formation in ion beam-irradiated thin Cu-Al and Ag-Al multilayers byin situ RBS and XRD
✍ Markwitz, A.; Matz, W.; Waldschmidt, M.; Demortier, G. πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 953 KB

Ion beam-induced interdi †usion and phase formation processes in thin Cu-Al and Ag-Al multilayers were investigated with in situ RBS and X-ray di †raction (XRD), respectively. The metal layers were deposited by evaporation on polished glassy carbon and single-crystal silicon substrates. In order to

Heating of ions moving in a gas under th
Heating of ions moving in a gas under the influence of a uniform and constant electric field
✍ Valeri V. Raznikov; Vyacheslav I. Kozlovsky; Alexander F. Dodonov; Marina O. Raz πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 69 KB πŸ‘ 3 views

A simple model for estimation of the internal temperature of ions, moving in a monoatomic gas under the influence of an electric field, is considered. The basic assumption of the model is formation of ion-atom complexes in a quasi-equilibrium state for some of the ion-atom collisions, and other coll

Mass displacements in ion trap mass spec
Mass displacements in ion trap mass spectrometry: Can they be related to electronic properties of the substituent groups of the ions under investigation?
✍ P. Traldi; S. Catinella; O. Bortolini πŸ“‚ Article πŸ“… 1992 πŸ› John Wiley and Sons 🌐 English βš– 131 KB

## OMS Letters Dear Sir Mass Displacements in Ion Trap Mass Spectrometry: Can They be Related to Electronic Properties of the Substituent Groups of the Ions Under Investigation? During experimental investigation of the mass displacements (AM) often encountered in ion trap' experiments, we faced,