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In-situ high temperature X-ray diffraction study of Co/SiC interface reactions

✍ Scribed by T. Fujimura; S.-I. Tanaka

Book ID: 111536624
Publisher: Springer
Year: 1999
Tongue: English
Weight: 106 KB
Volume: 34
Category: Article
ISSN: 0022-2461
DOI: 10.1023/a:1004750016287

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