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In situ high temperature synchrotron-radiation diffraction studies of silicidation processes in nanoscale Ni layers

✍ Scribed by J Rinderknecht; H Prinz; T Kammler; N Schell; E Zschech; K Wetzig; T Gessner

Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 569 KB
Volume: 70
Category: Article
ISSN: 0167-9317
DOI: 10.1016/s0167-9317(03)00419-2

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