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In situ high-temperature synchrotron-radiation diffraction studies of Ni and Co–Ni silicidation processes

✍ Scribed by J Rinderknecht; H Prinz; T Kammler; F Berberich; E Zschech


Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
664 KB
Volume
64
Category
Article
ISSN
0167-9317

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A high temperature X-ray diffraction method based on the Laue (transmission) mode was developed to measure strains associated with the growth of an oxide scale on a metal. These growth strains in the attached oxide scale and metal substrate are determined simultaneously and in real time by the chang