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In situ ellipsometry — A powerful tool for monitoring alkali doping of organic thin films

✍ Scribed by Haidu, F.; Ludemann, M.; Schäfer, P.; Gordan, O.D.; Zahn, D.R.T.


Book ID
122253737
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
642 KB
Volume
571
Category
Article
ISSN
0040-6090

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