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In situ electron spin resonance measurements of thermally induced metastable defects in doped hydrogenated amorphous silicon carbon films

✍ Scribed by Deyan He; Fangqing Zhang; Wei Chen; Guanghua Chen


Book ID
115987140
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
195 KB
Volume
114
Category
Article
ISSN
0022-3093

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