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In situ characterization of organometallic growth of ZnSe using grazing incidence X-ray scattering

✍ Scribed by D.W. Kisker; P.H. Fuoss; S. Brennan; G. Renaud; K.L. Tokuda; J.L. Kahn

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
505 KB
Volume
101
Category
Article
ISSN
0022-0248

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