𝔖 Bobbio Scriptorium
✦   LIBER   ✦

In Situ Characterization of Anodic Silicon Oxide Films by AC Impedance Measurements

✍ Scribed by Schmuki, P.


Book ID
121453569
Publisher
The Electrochemical Society
Year
1995
Tongue
English
Weight
992 KB
Volume
142
Category
Article
ISSN
0013-4651

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Characterization of hafnium anodic oxide
✍ M.J. Esplandiu; E.M. Patrito; V.A. Macagno πŸ“‚ Article πŸ“… 1995 πŸ› Elsevier Science 🌐 English βš– 773 KB

NaOH and HNO,. After film growth, AC impedance measurements were performed in the frequency range 0.1 Hz-1OOKHz. The impedance spectra of the oxides showed a multilayer structure as the oxide thickness increased, due to anion incorporation from the electrolyte and the corrosion process enhanced by