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Characterisation of titanium passivation films by in situ ac impedance measurements and XPS analysis

✍ Scribed by Carlos da Fonseca; Stephane Boudin; Manuel da Cunha Belo

Publisher: Elsevier
Year: 1994
Tongue: English
Weight: 515 KB
Volume: 379
Category: Article
ISSN: 1572-6657
DOI: 10.1016/0022-0728(94)87136-1

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