✦ LIBER ✦

Impurity Analysis of Silicon Epitaxial Layers by the 4.2 K Photoluminescence Spectroscopy

✍ Scribed by Herzog, R. ;Schramm, G. ;Flade, T.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Quantitative Analysis of Silicon Epitaxi

✍ Schramm, G. ;Geuther, H. ;Schneider, H. A. 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 517 KB

Quantitative Analysis of Shallow Impurit

✍ Schramm, G. ;Kretzer, U. 📂 Article 📅 1992 🏛 John Wiley and Sons 🌐 English ⚖ 401 KB

The rapid analysis of impurities and dop

✍ Donald H. Lemmon; J.C. Swartz 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 432 KB

4,2 K-Photoluminescence Study of the Ann

✍ J. Sickert; Dr. R. Herzog; Dr. T. Flade 📂 Article 📅 1986 🏛 John Wiley and Sons 🌐 English ⚖ 434 KB

The formation of the epitaxial CaF2/Si(1

✍ S. Bouzidi; F. Coletti; J.M. Debever; J.L. Longueville; P.A. Thiry 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 340 KB

Structural and morphological peculiariti

✍ Lilov, S. K. ;Tairov, Yu. M. ;Tsvetkov, V. F. ;Chernov, M. A. 📂 Article 📅 1976 🏛 John Wiley and Sons 🌐 English ⚖ 553 KB