𝔖 Bobbio Scriptorium
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Improving the accuracy of measurement of parts with contaminated surfaces by multichannel optoelectronic systems

✍ Scribed by V. I. Teleshevskii; V. V. Vasil'ev

Publisher
Springer US
Year
1995
Tongue
English
Weight
362 KB
Volume
38
Category
Article
ISSN
0543-1972

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