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Improving cross-correlation tests through re-sampling techniques

✍ Scribed by Belaire-Franch, Jorge; Contreras-Bayarri, Dulce


Book ID
120501168
Publisher
Taylor and Francis Group
Year
2002
Tongue
English
Weight
153 KB
Volume
29
Category
Article
ISSN
0266-4763

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The rocking-angle ion-milling technique has been employed to produce optimum Pt/Ti/SiO,/Si, WITiN/Si021Si, and (Pb,La)TiO,/Pt/MgO samples for cross-sectional transmission electron microscopy (TEM). Because of the different ion-milling rates between film layers and substrate materials, no satisfactor