Improvements in the Quasi-static Capacitance–Voltage Characterization of Semiconductor–Insulator Interface States (Si/SiO2)

✍ Scribed by I. B. Gulyaev; A. G. Zhdan; N. F. Kukharskaya; R. D. Tikhonov; G. V. Chucheva

• Book ID: 111609460
• Publisher: Springer
• Year: 2004
• Tongue: English
• Weight: 148 KB
• Volume: 33
• Category: Article
• ISSN: 1063-7397
• DOI: 10.1023/b:rumi.0000033828.42915.b1