Improvement of RF performance of GaAs/Si MESFETs using buried oxygen implantation

✍ Scribed by Sriram, S.; Messham, R.L.; Smith, T.J.; Eldridge, G.W.

• Book ID: 114536466
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 363 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.491261